| Poster Session II Oct. 17 (Tue) 16:45 - 18:45 (B1F) | ||
| TuP-01 | Image contrast mechanisms in a combined PEEM/LEEM investigation of organic layers on metals | Pierre L. Lévesque, Helder Marchetto, Ullrich Groh, Florian C. Maier, Tomáš Skála, Thomas Schmidt, Rainer Fink, Helmut Kuhlenbeck, Eberhard Umbach, Hans-Joachim Freund |
| TuP-02 | Self-assembly of supramolecular architectures on surfaces | Fawad S. Khokhar, Raoul van Gastel, Bene Poelsema |
| TuP-03 | In-situ Observation of the Growth of Nanodots on Ga Implanted SiO2 by LEEM | Ryan Buckmaster, FangZhun Guo, Takafumi Yao, Keisuke Kobayashi |
| TuP-04 | In situ observation of the phase transition on In/Cu(001) | Shinichiro Hatta, Fang Zhun Guo, Hiroshi Okuyama, Tetsuya Aruga |
| TuP-05 | Perturbation of Local Electric Field onto Surface Reaction Imaged by Photoemission Electron Microscopy | Hirokazu Fukidome, Masamichi Yoshimura, Kazuyuki Ueda, Fang-Zhun Guo, Toyohiko Kinoshita, Keisuke Kobayashi |
| TuP-06 | Synchrotron radiation induced XPEEM spectromicroscopy for nanoscience and nanotechnology | Nick Barrett, Olivier Renault, Luiz Zagonel, Aude Bailly, Nick Brookes, Julio Cezar |
| TuP-07 | High-pass Energy filtered PEEM Imaging of Dopants in Silicon | Miloš Hovorka, Luděk Frank, Dimitrij Valdaitsev, Sergej Nepijko, Hans-Joachim Elmers, Gerhard Schönhense |
| TuP-08 | Surface reactions of Fe on SiO2 thin layer/Si substrates studied by SPELEEM | Fumihiko Maeda, Hiroki Hibino, Satoru Suzuki, FangZhun Guo |
| TuP-09 | Optical Response of Alkali-Metal-deposited 1T-TiS2 surfaces | T. Wakita, Y. Saitoh, K. Kobayashi, S. Negishi, M. Arita, H. Namatame, M. Koyano, M. Hirai, Y. Muraoka, T. Yokoya |
| TuP-10 | SPELEEM Study on Growth of Sb on In/Si(111) Surfaces | T. Yasue, F. -Z. Guo, A. Nakaguchi, M. Hashimoto, M. Ueda, T. Matsushita, Y. Tamenori, M. Oura, T. Takeuchi, Y. Saito, S. Shin, T. Kinoshita, K. Kobayashi, T. Koshikawa |
| TuP-11 | UV-PEEM Contrast Mechanism on Cu/W(110) | H. Shimizu, M. Hashimoto, M. Ueda, A. Nakaguchi, T. Yasue, E. Bauer, T. Koshikawa |
| TuP-12 | Dynamic Observation of Restructuring process of Cu/W(110) with LEEM and Limited Area LEED | H. Shimizu, A. Nakaguchi, T. Yasue, E. Bauer, T. Koshikawa |
| TuP-13 | Mapping of chemical bond states of Ag/Si(111) with synchrotron orbital radiation photo emission electron microscope | M. Hashimoto, M. Ueda, F. -Z. Guo, M. Suzuki, T. Kinoshita, K. Kobayashi, S. Shin, M. Oura, T. Takeuchi, Y. Saito, T. Matsushita, T. Yasue, T. Koshikawa |
| TuP-14 | Dynamic observation of Ag on In/Si (111) by LEEM | M. Ueda, M. Hashimoto, M. Suzuki, T. Yasue, T. Koshikawa |
| TuP-15 | Imaging Diffusion Zones in Photoelectron Emission Microscopy | K. R. Roos, K.L. Roos, I. Lohmar, J. Krug, M. Horn-von Hoegen, F.-J. Meyer zu Heringdorf |
| TuP-16 | PEEM/EXPEEM Investigation of the Au on Ta Polycrystalline | Testuya Tsutsumi, Takeshi Miyamoto, Hironobu Niimi, Yoshinori Kitajima, Yuji Sakai, Makoto Kato, Kiyotaka Asakura |
| TuP-17 | Real Time Observation of Multi Emitters by LEEM, PEEM and FEEM | Hidekazu Murata, Yoshiyuki Nishimura, Hiroshi Shimoyama, Akinori Mogami, Yuji Sakai, Masato Kudo, Makoto Kato, Keiichi Betsui, Kazunori Inoue, Kazuto Sakemura, Nobuyasu Negishi |
| TuP-18 | Low Energy Electron Microscopy Investigation of CO Adsorption on the Pt(111) Surface | C. M. Yim, K. L. Man, M. S. Altman |
| TuP-19 | Temperature Dependence of the Step Line Tension and Island Decay on the Si(111) (1x1) Surface | A. Pang, K. L. Man, T. Stasevich, F. Szalma, T. L Einstein, M. S. Altman |
| TuP-20 | New Pt,Rh-CeOx Catalytic Systems Prepared from Intermetallic Compounds | P. A. Zosimova, A. V. Smirnov, S. N. Nesterenko, V. V. Yushenko, I .I. Ivanova |
| TuP-21 | Application of photoelectron emission microscope (PEEM) on extraterrestrial materials | Masato Kotsugi, Takanori Wakita, Toshiyuki Taniuchi, Kanta Ono, Motohiro Suzuki, Naomi Kawamura, Masaharu Oshima, Naoki Ishimatsu, Masaki Taniguchi, Hiroshi Maruyama |
| TuP-22 | Study of cations and charge distribution in swelling clay sheets by XPEEM | D. Vantelon, R. Belkhou, I. Bihannic, E. Montargès-Pelletier, L.J. Michot, S. Maddi, J.L. Robert, O. Mentes, L. Aballe, A. Locatelli |
| TuP-23 | First results from the X-ray photoelectron emission microscopy facility at the Canadian Light Source | Stephen G. Urquhart, Uday D. Lanke, Eric Christensen, Rémy Coulombe, Stephen Christensen, Brian Haines, Adam P. Hitchcock, Peter Hitchcock, Jacob Stewart–Ornstein, Bob Hall, Kim Kenny, Stefan Chiovelli, Konstantine Kaznatcheev, Chithra Karunakaran |
| TuP-24 | Photoelectron emission microscopy (PEEM) on bilayer manganite La1.1Sr1.9Mn2O7 | M. Kubota, T. Taniuchi, M. Oshima, H. Akinaga, K. Ono |
| TuP-25 | NanoESCA Applications: Trace Element Analysis of Meteorite Grains | P. Bernhard, G. Schönhense, U. Ott, S. Schmidt, F. Forster, F. Reinert, M. Escher, N. Weber, M. Merkel, B. Krömker, D. Funnemann |
| TuP-26 | Defect Inspection on Masks for EUV (13.5 nm) Lithography Using “Standing-Wave PEEM” | A. Oelsner, D.Valdaitsev, G. Schönhense, N. Weber, M. Escher, M. Merkel, J. Lin, U. Neuhäusler, J. Slieh, A. Brechling, U. Heinzmann, U. Kleineberg |
| TuP-27 | Application of SLEEM for Observation of Al based Composite Materials | K. Matsuda, S. Ikeno, I. Mullerova, L. Frank |
| TuP-28 | Microscopic Analyses of Static Random Access Memory | Junichi Tsuji, Hiroaki Miyata, Manabu Fujita, Hideki Hashimoto, Fang-Zhun Guo, Toyohiko Kinoshita |
| TuP-29 | Application of SPELEEM to high-k gate dielectrics: relationship between surface morphology and photoelectron spectra during Hf-silicide formation | Ryutaro Yasuhara, Toshiyuki Taniuchi, Hiroshi Kumigashira, Masaharu Oshima, Fangzhun Guo, Kanta Ono, Toyohiko Kinoshita, Kazuto Ikeda, Guo-Lin Liu, Ziyuan Liu, Koji Usuda |
| TuP-30 | Origin of the dopant contrast in PEEM micrographs | Luděk Frank, Ilona Müllerová, Dimitrii Valdaitsev, Sergei Nepijko, Andrei Gloskovskii, Hans-Joachim Elmers, Gerhard Schönhense |
| TuP-31 | LEEM Observation of Dynamic Phase Transformation in Steel | Shun-ichi Hayashi, Hiroshi Shimizu, Tsuneo Yasue, Takanori Koshikawa, Ernst Bauer |
| TuP-32 | Installation of SPELEEM at BL17SU/SPring-8 | F. Z. Guo, Y. Saitoh, T. Muro, T. Matsushita, T. Wakita, H. Ohashi, Y. Senba, T. Kinoshita, K. Kobayashi, T. Koshikawa, T. Yasue, M. Oura, T. Takeuchi, S. Shin |
| TuP-33 | Surface concentration mapping of InAs/GaAs quantum dots | G. Biasiol, S. Heun, G. B. Golinelli, L. Sorba, V. Grillo, E. Carlino, A. Locatelli, T. O. Mentes, F. Z. Guo |
| TuP-34 | Observation of Spin Reor ientation at the Inter face of Fe/NiO(001) by X-r ay Photoemission Electron Micr oscopy | Hai-Lin Sun, Fang-Zhun Guo, Kuniaki Arai, Keiji Kura, Yuuki Maeda, Taichi Okuda, Hiroaki Miyata, Tomohiro Matsushita, Yusuke Tamenori, Takayuki Muro, Keisuke Kobayashi, Keiki Fukumoto, Takanori Wakita, Toyohiko Kinoshita |
| TUP-35 | Low Temperature Photoemission Electron Microscope | Taichi Okuda, Takanori Wakita, Franz Ulrich Hillebrecht, Ayumi Harasawa, Hideyuki Kiwata, Masaharu Oshima, Toyohiko Kinoshita |